Showing 251–275 of 277 results
- Parallelism: 0.5 arc minutes or better
- Size: 0.500 +0.0 / -0.005
- Thickness: 0.085 +0.0 / -0.12
- Scratch-Dig: 60/40
- Clear Aperture: 0.400 inch
- Flatness: TWF: 1 pwr, 0.5 irreg
- Substrate Material: Zinc Selenide
- Wavelength: SLOAN R
- Operating Temperature: 23.0
- Parallelism: 30 arc seconds or better
- Bandwidth (FWHM): 139.0
- Minimum Transmission: 80%
- Blocking: 1x10-4 avg. X-Ray to 1100nm
- Reflection: N/A
- Size: 25.0 Ø +0.0 / -0.25
- Thickness: 5.0 ±0.1
- Scratch-Dig: 60/40
- Clear Aperture: 85% of OD
- Flatness: 1/4 per inch or better
- Angle of Incidence: 0
- Wavelength: SLOAN U
- Operating Temperature: 23.0
- Parallelism: 30 arc seconds or better
- Bandwidth (FWHM): 60.0
- Minimum Transmission: 55%
- Blocking: 1x10-4 avg. X-Ray to 1100nm
- Reflection: N/A
- Size: 25.0 Ø +0.0 / -0.25
- Thickness: 5.0 ±0.1
- Scratch-Dig: 60/40
- Clear Aperture: 85% of OD
- Flatness: 1/4 per inch or better
- Angle of Incidence: 0
- Wavelength: SLOAN Z
- Operating Temperature: 23.0
- Parallelism: 30 arc seconds or better
- Bandwidth (FWHM): 104.0
- Minimum Transmission: 80%
- Blocking: 1x10-4 avg. X-Ray to 1100nm
- Reflection: N/A
- Size: 25.0 Ø +0.0 / -0.25
- Thickness: 5.0 ±0.1
- Scratch-Dig: 60/40
- Clear Aperture: 85% of OD
- Flatness: 1/4 per inch or better
- Angle of Incidence: 0
- Wavelength: 420 - 700
- Operating Temperature: 23.0
- Parallelism: 30 arc seconds or better
- Transmission: 70 ±5%
- Reflection: R = 30 ±5%
- Size: 25.0 Ø +0 / -0.2
- Thickness: 3.0 ±0.25
- Scratch-Dig: 60/40
- Clear Aperture: 22mm Ø min
- Flatness: 1/4 wave per inch or better
- Substrate: Fused Silica
- Angle of Incidence: 45.0
- Wavelength: 420 - 700
- Operating Temperature: 23.0
- Parallelism: 30 arc seconds or better
- Transmission: 70 ±5%
- Reflection: R = 30 ±5%
- Size: 50.0 Ø +0 / -0.2
- Thickness: 3.0 ±0.25
- Scratch-Dig: 60/40
- Clear Aperture: 45mm min
- Flatness: 1/4 wave per inch or better
- Substrate: Fused Silica
- Angle of Incidence: 45.0
- Wavelength: 420 - 700
- Operating Temperature: 23.0
- Parallelism: 30 arc seconds or better
- Transmission: 70 ±5%
- Reflection: R = 30 ±5%
- Size: 50.0 x 50.0 +0 / -0.2
- Thickness: 3.0 ±0.25
- Scratch-Dig: 60/40
- Clear Aperture: 45mm min
- Flatness: 1/4 wave per inch or better
- Substrate: Fused Silica
- Angle of Incidence: 45.0
- Wavelength: 420 - 700
- Operating Temperature: 23.0
- Parallelism: 30 arc seconds or better
- Transmission: 60 ±5%
- Reflection: R = 40 ±5%
- Size: 25.0 Ø +0 / -0.2
- Thickness: 3.0 ±0.25
- Scratch-Dig: 60/40
- Clear Aperture: 22mm Ø min
- Flatness: 1/4 wave per inch or better
- Substrate: Fused Silica
- Angle of Incidence: 45.0
- Wavelength: 420 - 700
- Operating Temperature: 23.0
- Parallelism: 30 arc seconds or better
- Transmission: 60 ±5%
- Reflection: R = 40 ±5%
- Size: 50.0 Ø +0 / -0.2
- Thickness: 3.0 ±0.25
- Scratch-Dig: 60/40
- Clear Aperture: 45mm min
- Flatness: 1/4 wave per inch or better
- Substrate: Fused Silica
- Angle of Incidence: 45.0
- Wavelength: 420 - 700
- Operating Temperature: 23.0
- Parallelism: 30 arc seconds or better
- Transmission: 60 ±5%
- Reflection: R = 40 ±5%
- Size: 50.0 x 50.0 +0 / -0.2
- Thickness: 3.0 ±0.25
- Scratch-Dig: 60/40
- Clear Aperture: 45mm min
- Flatness: 1/4 wave per inch or better
- Substrate: Fused Silica
- Angle of Incidence: 45.0
- Wavelength: SLOAN R
- Operating Temperature: 23.0
- Parallelism: 30 arc seconds or better
- Bandwidth (FWHM): 139.0
- Minimum Transmission: 80%
- Blocking: 1x10-4 avg. X-Ray to 1100nm
- Reflection: N/A
- Size: 50.0 Ø +0.0 / -0.25
- Thickness: 5.0 ±0.1
- Scratch-Dig: 60/40
- Clear Aperture: 85% of OD
- Flatness: 1/4 per inch or better
- Angle of Incidence: 0
- Wavelength: SLOAN U
- Operating Temperature: 23.0
- Parallelism: 30 arc seconds or better
- Bandwidth (FWHM): 60.0
- Minimum Transmission: 55%
- Blocking: 1x10-4 avg. X-Ray to 1100nm
- Reflection: N/A
- Size: 50.0 Ø +0.0 / -0.25
- Thickness: 5.0 ±0.1
- Scratch-Dig: 60/40
- Clear Aperture: 85% of OD
- Flatness: 1/4 per inch or better
- Angle of Incidence: 0
- Wavelength: SLOAN Z
- Operating Temperature: 23.0
- Parallelism: 30 arc seconds or better
- Bandwidth (FWHM): 104.0
- Minimum Transmission: 80%
- Blocking: 1x10-4 avg. X-Ray to 1100nm
- Reflection: N/A
- Size: 50.0 Ø +0.0 / -0.25
- Thickness: 5.0 ±0.1
- Scratch-Dig: 60/40
- Clear Aperture: 85% of OD
- Flatness: 1/4 per inch or better
- Angle of Incidence: 0
- Wavelength: 420 - 700
- Operating Temperature: 23.0
- Parallelism: 30 arc seconds or better
- Transmission: 50 ±5%
- Reflection: R = 50 ±5%
- Size: 25.0 Ø +0 / -0.2
- Thickness: 3.0 ±0.25
- Scratch-Dig: 60/40
- Clear Aperture: 22mm Ø min
- Flatness: 1/4 wave per inch or better
- Substrate: Fused Silica
- Angle of Incidence: 45.0
- Wavelength: 420 - 700
- Operating Temperature: 23.0
- Parallelism: 30 arc seconds or better
- Transmission: 50 ±5%
- Reflection: R = 50 ±5%
- Size: 50.0 Ø +0 / -0.2
- Thickness: 3.0 ±0.25
- Scratch-Dig: 60/40
- Clear Aperture: 45mm min
- Flatness: 1/4 wave per inch or better
- Substrate: Fused Silica
- Angle of Incidence: 45.0
- Wavelength: 420 - 700
- Operating Temperature: 23.0
- Parallelism: 30 arc seconds or better
- Transmission: 50 ±5%
- Reflection: R = 50 ±5%
- Size: 50.0 x 50.0 +0 / -0.2
- Thickness: 3.0 ±0.25
- Scratch-Dig: 60/40
- Clear Aperture: 45mm min
- Flatness: 1/4 wave per inch or better
- Substrate: Fused Silica
- Angle of Incidence: 45.0
- Wavelength: 420 - 700
- Operating Temperature: 23.0
- Parallelism: 30 arc seconds or better
- Transmission: 40 ±5%
- Reflection: R = 60 ±5%
- Size: 25.0 Ø +0 / -0.2
- Thickness: 3.0 ±0.25
- Scratch-Dig: 60/40
- Clear Aperture: 22mm Ø min
- Flatness: 1/4 wave per inch or better
- Substrate: Fused Silica
- Angle of Incidence: 45.0
- Wavelength: 420 - 700
- Operating Temperature: 23.0
- Parallelism: 30 arc seconds or better
- Transmission: 40 ±5%
- Reflection: R = 60 ±5%
- Size: 50.0 Ø +0 / -0.2
- Thickness: 3.0 ±0.25
- Scratch-Dig: 60/40
- Clear Aperture: 45mm min
- Flatness: 1/4 wave per inch or better
- Substrate: Fused Silica
- Angle of Incidence: 45.0
- Wavelength: 420 - 700
- Operating Temperature: 23.0
- Parallelism: 30 arc seconds or better
- Transmission: 40 ±5%
- Reflection: R = 60 ±5%
- Size: 50.0 x 50.0 +0 / -0.2
- Thickness: 3.0 ±0.25
- Scratch-Dig: 60/40
- Clear Aperture: 45mm min
- Flatness: 1/4 wave per inch or better
- Substrate: Fused Silica
- Angle of Incidence: 45.0
- Wavelength: 420 - 700
- Operating Temperature: 23.0
- Parallelism: 30 arc seconds or better
- Transmission: 30 ±5%
- Reflection: R = 70 ±5%
- Size: 25.0 Ø +0 / -0.2
- Thickness: 3.0 ±0.25
- Scratch-Dig: 60/40
- Clear Aperture: 22mm Ø min
- Flatness: 1/4 wave per inch or better
- Substrate: Fused Silica
- Angle of Incidence: 45.0
- Wavelength: 420 - 700
- Operating Temperature: 23.0
- Parallelism: 30 arc seconds or better
- Transmission: 30 ±5%
- Reflection: R = 70 ±5%
- Size: 50.0 Ø +0 / -0.2
- Thickness: 3.0 ±0.25
- Scratch-Dig: 60/40
- Clear Aperture: 45mm min
- Flatness: 1/4 wave per inch or better
- Substrate: Fused Silica
- Angle of Incidence: 45.0
- Wavelength: 420 - 700
- Operating Temperature: 23.0
- Parallelism: 30 arc seconds or better
- Transmission: 30 ±5%
- Reflection: R = 70 ±5%
- Size: 50.0 x 50.0 +0 / -0.2
- Thickness: 3.0 ±0.25
- Scratch-Dig: 60/40
- Clear Aperture: 45mm min
- Flatness: 1/4 wave per inch or better
- Substrate: Fused Silica
- Angle of Incidence: 45.0
- Wavelength: 420 - 700
- Operating Temperature: 23.0
- Parallelism: 30 arc seconds or better
- Transmission: 20 ±5%
- Reflection: R = 80 +/-5%
- Size: 25.0 Ø +0 / -0.2
- Thickness: 3.0 ±0.25
- Scratch-Dig: 60/40
- Clear Aperture: 22mm Ø min
- Flatness: 1/4 wave per inch or better
- Substrate: Fused Silica
- Angle of Incidence: 45.0
- Wavelength: 420 - 700
- Operating Temperature: 23.0
- Parallelism: 30 arc seconds or better
- Transmission: 20+/-5%
- Reflection: R = 80 +/-5%
- Size: 50.0 Ø +0 / -0.2
- Thickness: 3.0 ±0.25
- Scratch-Dig: 60/40
- Clear Aperture: 45mm min
- Flatness: 1/4 wave per inch or better
- Substrate: Fused Silica
- Angle of Incidence: 45.0
- Wavelength: 420 - 700
- Operating Temperature: 23.0
- Parallelism: 30 arc seconds or better
- Transmission: 20 ±5%
- Reflection: R = 80 ±5%
- Size: 50.0 x 50.0 +0 / -0.2
- Thickness: 3.0 ±0.25
- Scratch-Dig: 60/40
- Clear Aperture: 45mm min
- Flatness: 1/4 wave per inch or better
- Substrate: Fused Silica
- Angle of Incidence: 45.0
PART NO.
DESCRIPTION
1 - 5 pcs.
6 - 10 pcs.
> 10 pcs.
Stock Status
$123.00
$123.00
$123.00
In Stock: 62
$307.00
$264.00
$233.00
In Stock
$307.00
$264.00
$233.00
In Stock
$307.00
$264.00
$233.00
In Stock
$159.00
$137.00
$121.00
In Stock
$308.00
$265.00
$234.00
In Stock
$320.00
$275.00
$243.00
In Stock
$159.00
$137.00
$121.00
In Stock
$308.00
$265.00
$234.00
In Stock
$320.00
$275.00
$243.00
In Stock
$790.00
$679.00
$600.00
In Stock
$790.00
$679.00
$600.00
In Stock
$790.00
$679.00
$600.00
In Stock
$159.00
$137.00
$121.00
In Stock
$308.00
$265.00
$234.00
In Stock
$320.00
$275.00
$243.00
In Stock
$159.00
$137.00
$121.00
In Stock
$308.00
$265.00
$234.00
In Stock
$320.00
$275.00
$243.00
In Stock
$159.00
$137.00
$121.00
In Stock
$308.00
$265.00
$234.00
In Stock
$320.00
$275.00
$243.00
In Stock
$159.00
$137.00
$121.00
In Stock
$308.00
$265.00
$234.00
In Stock
$320.00
$275.00
$243.00
In Stock