Surplus - IR Bandpass Filters
Surplus - IR Bandpass Filters
Surplus IR Bandpass Filters from Andover Corporation offer exceptional value on premium infrared optical filters at reduced prices. These specialized filters isolate specific regions of the infrared spectrum while providing high transmission of desired energy and deep rejection of unwanted radiation.
Constructed with hard, durable first-surface dielectric coatings on optical-quality IR-transmitting substrates, these surplus filters maintain the same exacting standards as our regular product line. Available in a range of center wavelengths and bandwidths, they're ideal for researchers, educational institutions, and companies seeking cost-effective solutions for environmental monitoring, security systems, thermal imaging, and specialized infrared applications. Despite being offered at discounted prices, these filters deliver excellent optical performance and durability, capable of withstanding normal cleaning and handling required of high-quality optical components. Inventory changes regularly based on availability, so we recommend checking our listings frequently for the best selection.
Showing 1–25 of 169 results
- Wavelength: 2525.0 ±10
- Emission Line: N/A
- Operating Temperature: 23.0
- Parallelism: Commercial
- Bandwidth (FWHM): 30.0 ±8.0 nm
- Minimum Transmission: 70%
- Blocking: 1x10-3 avg. X-Ray to 30µ
- Size: 25.0 Ø +0.0 / -0.25
- Thickness: 1.0 ±0.2
- Scratch-Dig: 80/50
- Clear Aperture: 21mm Ø min
- Flatness: Commercial
- Effective Refractive Index: N/A
- Substrate: Sapphire
- Gas: N/A
- Wavelength: 2525.0 ±10
- Emission Line: N/A
- Operating Temperature: 23.0
- Parallelism: Commercial
- Bandwidth (FWHM): 30.0 ±8.0 nm
- Minimum Transmission: 70%
- Blocking: 1x10-3 avg. X-Ray to 30µ
- Size: 25.0 Ø +0.0 / -0.25
- Thickness: 1.0 ±0.2
- Scratch-Dig: 80/50
- Clear Aperture: 21mm Ø min
- Flatness: Commercial
- Effective Refractive Index: N/A
- Substrate: Sapphire
- Gas: N/A
- Wavelength: 2580 ±15
- Emission Line: N/A
- Operating Temperature: 23.0
- Parallelism: Commercial
- Bandwidth (FWHM): 90 ±15 nm
- Minimum Transmission: 75%
- Blocking: 1x10-3 avg. X-Ray to 30µ
- Size: 25.0 Ø +0 / -0.25
- Thickness: 1.0 ±0.2
- Scratch-Dig: 80/50
- Clear Aperture: 21mm Ø min
- Flatness: Commercial
- Effective Refractive Index: N/A
- Substrate: Sapphire
- Gas: Water vapor
- Wavelength: 2660 ±30
- Emission Line: N/A
- Operating Temperature: 23.0
- Parallelism: < 5 arc minutes
- Bandwidth (FWHM): 95 ±20 nm
- Minimum Transmission: 70%
- Blocking: 1x10-3 avg. X-Ray to 30µ
- Size: 25.0 Ø +0 / -0.2
- Thickness: 1.0 ±0.2
- Scratch-Dig: 80/50
- Clear Aperture: 21mm Ø min
- Flatness: 2 or better at 633
- Effective Refractive Index: N/A
- Substrate: Sapphire
- Gas: Water vapor
- Wavelength: 2735 ±30
- Emission Line: N/A
- Operating Temperature: 23.0
- Parallelism: Commercial
- Bandwidth (FWHM): 100 ±30 nm
- Minimum Transmission: 80%
- Blocking: 1x10-3 avg. X-Ray to 30µ
- Size: 25.0 Ø nom. / -.25
- Thickness: 1.0 ±.2
- Scratch-Dig: 80/50
- Clear Aperture: N/A
- Flatness: Commercial
- Effective Refractive Index: N/A
- Substrate: Sapphire
- Gas: N/A
- Wavelength: 2745 ±10
- Emission Line: N/A
- Operating Temperature: 23°
- Parallelism: Commercial
- Bandwidth (FWHM): 50.0 ±10 nm
- Minimum Transmission: 75%
- Blocking: 1 x 10-3 avg. X-Ray to 30um
- Size: 12.5 +0.0 / -0.25
- Thickness: 1.0 ±0.2
- Scratch-Dig: 80/50
- Clear Aperture: 11mm
- Flatness: Commercial
- Effective Refractive Index: N/A
- Substrate: Sapphire
- Gas: N/A
- Wavelength: 2900 ±20
- Emission Line: N/A
- Operating Temperature: 23.0
- Parallelism: < 5 arc minutes
- Bandwidth (FWHM): 100 ±20 nm
- Minimum Transmission: 85%
- Blocking: 1x10-3 avg. X-Ray to 30µ
- Size: 25.0 Ø +0 / -0.25
- Thickness: 1.0 ±0.2
- Scratch-Dig: 80/50
- Clear Aperture: 21mm Ø min
- Flatness: 2 or better at 633
- Effective Refractive Index: N/A
- Substrate: Sapphire
- Gas: Water vapor
- Wavelength: 2900 ±30
- Emission Line: N/A
- Operating Temperature: 23.0
- Parallelism: < 5 arc minutes
- Bandwidth (FWHM): 100 ±15 nm
- Minimum Transmission: 80%
- Blocking: 1x10-3 avg. X-Ray to 30µ
- Size: 25.0 Ø +0 / -0.25
- Thickness: 1.0 ±0.2
- Scratch-Dig: 80/50
- Clear Aperture: 21mm Ø min
- Flatness: 2 or better at 633
- Effective Refractive Index: N/A
- Substrate: Sapphire
- Gas: Water vapor
- Wavelength: 2900.0 ±10
- Emission Line: N/A
- Operating Temperature: 23.0
- Parallelism: < 10 arc minutes
- Bandwidth (FWHM): 110 ±30 nm
- Minimum Transmission: 85%
- Blocking: 1x10-3 avg. X-Ray to 30µ
- Size: 25.0 Ø +0 / -0.25
- Thickness: 1.0 ±0.2
- Scratch-Dig: 80/50
- Clear Aperture: 21mm Ø min
- Flatness: 5 or better at of Interest
- Effective Refractive Index: N/A
- Substrate: Sapphire
- Gas: Water vapor
- Wavelength: 2990.0 ±30
- Emission Line: N/A
- Operating Temperature: 23.0
- Parallelism: < 5 arc minutes
- Bandwidth (FWHM): 100 ±30 nm
- Minimum Transmission: 75%
- Blocking: 1x10-3 avg. X-Ray to 30µ
- Size: 25.0 Ø +0 / -0.2
- Thickness: 1.0 ±0.2
- Scratch-Dig: 80/50
- Clear Aperture: 22mm dia.
- Flatness: 2 or better at 633
- Effective Refractive Index: N/A
- Substrate: Sapphire
- Gas: Water vapor
- Wavelength: 3000 ±30
- Emission Line: N/A
- Operating Temperature: 23
- Parallelism: Commercial
- Bandwidth (FWHM): 120 ±30 nm
- Minimum Transmission: 75%
- Blocking: <0.1% avg X-ray to 30000nm
- Size: 25.0 Ø +0 / -0.2
- Thickness: 1.0 ±0.2
- Scratch-Dig: 80/50
- Clear Aperture: 22mm Ø min
- Flatness: Commercial
- Effective Refractive Index: N/A
- Substrate: Sapphire
- Gas: N/A
- Wavelength: 3000.0 ±30
- Emission Line: N/A
- Operating Temperature: 23.0
- Parallelism: < 5 arc minutes
- Bandwidth (FWHM): 100.0 ±30 nm
- Minimum Transmission: 75%
- Blocking: 1x10-3 avg. X-Ray to 30µ
- Size: 25.0 Ø +0 / -0.2
- Thickness: 1.0 ±0.2
- Scratch-Dig: 80/50
- Clear Aperture: 21mm Ø min
- Flatness: 2 or better at 633
- Effective Refractive Index: N/A
- Substrate: Sapphire
- Gas: Water vapor
- Wavelength: 3030 ±30
- Emission Line: N/A
- Operating Temperature: 23.0
- Parallelism: Commercial
- Bandwidth (FWHM): 850 ±50 nm
- Minimum Transmission: >85% avg.
- Blocking: 1x10-3 avg. 300nm to 7,500nm
- Size: 0.995 Ø ±0.005
- Thickness: 0.040 ±.004
- Scratch-Dig: 80/50
- Clear Aperture: 23mm Ø min
- Flatness: Commercial
- Effective Refractive Index: N/A
- Substrate: Silicon
- Gas: N/A
- Wavelength: 3040 ±20
- Emission Line: N/A
- Operating Temperature: 23.0
- Parallelism: Commercial
- Bandwidth (FWHM): 105 ±10 nm
- Minimum Transmission: 75%
- Blocking: 1x10-3 avg. X-Ray to 30µ
- Size: 25.0 Ø +0 / -0.25
- Thickness: 1.0 ±0.2
- Scratch-Dig: 80/50
- Clear Aperture: 21mm Ø min
- Flatness: Commercial
- Effective Refractive Index: N/A
- Substrate: Sapphire
- Gas: Methanol and Ethanol
- Wavelength: 3075 ±20
- Emission Line: N/A
- Operating Temperature: 23.0
- Parallelism: Commercial
- Bandwidth (FWHM): 105 ±10 nm
- Minimum Transmission: 75%
- Blocking: 1x10-3 avg. X-Ray to 30µm
- Size: 25.0 Ø +0 / -0.25
- Thickness: 1.0 ±0.2
- Scratch-Dig: 80/50
- Clear Aperture: 21mm Ø min
- Flatness: Commercial
- Effective Refractive Index: N/A
- Substrate: Sapphire
- Gas: Methanol and Ethanol
- Wavelength: 3100 ±75
- Emission Line: N/A
- Operating Temperature: 23.0
- Parallelism: Commercial
- Bandwidth (FWHM): 1300 ±100 nm
- Minimum Transmission: 85%
- Blocking: 1x10-3 avg. X-Ray to 5500nm
- Size: 25.0 Ø ±0.1
- Thickness: 1.0 ±0.2
- Scratch-Dig: 80/50
- Clear Aperture: 22mm Ø min
- Flatness: Commercial
- Effective Refractive Index: N/A
- Substrate: Germanium
- Gas: N/A
- Wavelength: 3100 ±75
- Emission Line: N/A
- Operating Temperature: 23
- Parallelism: Commercial
- Bandwidth (FWHM): 1300 ±100 nm
- Minimum Transmission: 85%
- Blocking: 1x10-3 avg. X-Ray to 5,450nm
- Size: 50.0 Ø ±0.1
- Thickness: 1.0 ±0.2
- Scratch-Dig: 80/50
- Clear Aperture: N/A
- Flatness: Commercial
- Effective Refractive Index: N/A
- Substrate: Germanium
- Gas: N/A
- Wavelength: 3100 ±30
- Emission Line: N/A
- Operating Temperature: 23.0
- Parallelism: Commercial
- Bandwidth (FWHM): 950 ±50 nm
- Minimum Transmission: >85% avg.
- Blocking: 1x10-3 avg. 300nm to 7,500nm
- Size: 0.995 Ø ±0.005
- Thickness: 0.040 ±nom
- Scratch-Dig: 80/50
- Clear Aperture: 23mm Ø min
- Flatness: Commercial
- Effective Refractive Index: N/A
- Substrate: Silicon
- Gas: N/A
- Wavelength: 3200 ±50
- Emission Line: N/A
- Operating Temperature: 23.0
- Parallelism: Commercial
- Bandwidth (FWHM): 900 ±50 nm
- Minimum Transmission: >90% avg.
- Blocking: 1x10-3 avg. 300nm to 8,000nm
- Size: 0.995 Ø ±0.005
- Thickness: 0.040 ±nom
- Scratch-Dig: 80/50
- Clear Aperture: 22mm Ø min
- Flatness: Commercial
- Effective Refractive Index: N/A
- Substrate: Silicon
- Gas: N/A
- Wavelength: 3283.0 ±40
- Emission Line: N/A
- Operating Temperature: 23.0
- Parallelism: Commercial
- Bandwidth (FWHM): 135.0 ±30 nm
- Minimum Transmission: 75%
- Blocking: OD3 avg. from UV-30um
- Size: 25.0 Ø +0 / -0.25
- Thickness: 1.0 ±0.2
- Scratch-Dig: 80/50
- Clear Aperture: 22mm Ø min
- Flatness: Commercial
- Effective Refractive Index: N/A
- Substrate: Sapphire
- Gas: N/A
- Wavelength: 3330 ±20.0
- Emission Line: N/A
- Operating Temperature: 23.0
- Parallelism: Commercial
- Bandwidth (FWHM): 150 ±20.0 nm
- Minimum Transmission: 80%
- Blocking: 1 x 10-3 avg. X-Ray to 7500nm
- Size: 12.5 Ø +0.0 / -0.2
- Thickness: 1.0 ±0.1
- Scratch-Dig: 60/40
- Clear Aperture: 11mm Ø min
- Flatness: Commercial
- Effective Refractive Index: N/A
- Substrate: Silicon
- Gas: N/A
- Wavelength: 3370 ±30
- Emission Line: N/A
- Operating Temperature: 23.0
- Parallelism: Commercial
- Bandwidth (FWHM): 120 ±30 nm
- Minimum Transmission: 83%
- Blocking: 1x10-3 avg. X-Ray to 30µ
- Size: 25.0 Ø +0 / -0.25
- Thickness: 1.0 ±0.2
- Scratch-Dig: 80/50
- Clear Aperture: 22mm Ø min
- Flatness: Commercial
- Effective Refractive Index: N/A
- Substrate: Sapphire
- Gas: N/A
- Wavelength: 3375 ±20
- Emission Line: N/A
- Operating Temperature: 23.0
- Parallelism: Commercial
- Bandwidth (FWHM): 200 ±20 nm
- Minimum Transmission: 80%
- Blocking: >OD2.5 avg. X-Ray to 30um
- Size: 12.5 +0.0 / -0.2
- Thickness: 1.0 ±0.2
- Scratch-Dig: 80/50
- Clear Aperture: 11mm
- Flatness: Commercial
- Effective Refractive Index: N/A
- Substrate: Sapphire
- Gas: N/A
- Wavelength: 3500 ±200
- Emission Line: N/A
- Operating Temperature: 23.0
- Parallelism: Commercial
- Bandwidth (FWHM): 2000 ±200 nm
- Minimum Transmission: 80%
- Blocking: T(avg) <0.1 UV to 7000nm
- Size: 25.0 Ø +0.0 / -0.2
- Thickness: 1.0 ±0.25
- Scratch-Dig: 80/50
- Clear Aperture: 21mm Ø min
- Flatness: Commercial
- Effective Refractive Index: N/A
- Substrate: Silicon
- Gas: N/A
- Wavelength: 3600 ±50
- Emission Line: N/A
- Operating Temperature: 23
- Parallelism: Commercial
- Bandwidth (FWHM): 1000 ±100 nm
- Minimum Transmission: 85
- Blocking: T(avg) <0.1 X-ray to 6150nm
- Size: 25.0 Ø +0.0 / -0.1
- Thickness: 2.28 ±0.1
- Scratch-Dig: 80/50
- Clear Aperture: 22mm Ø min
- Flatness: 3 -5 per inch
- Effective Refractive Index: N/A
- Substrate: Silicon
- Gas: N/A