Standard IR Bandpass Filters
Standard IR Bandpass Filters
Andover Corporation's standard IR bandpass filters are precision-engineered optical components designed specifically for gas analysis applications in the infrared spectrum.
These filters feature durable first-surface dielectric coatings on high-quality IR-transmitting substrates, enabling precise wavelength selection from 2.7µm to 14µm.
Built for reliability and performance, these filters combine superior optical qualities with robust construction to deliver consistent results in demanding applications.
- High-quality optical performance with precise wavelength selection
- Durable first-surface dielectric coatings for extended lifetime
- Available from stock for quick delivery
- Custom sizes and shapes available
- Suitable for high-volume production
- Normal cleaning and handling durability
- Compatible with standard optical mounting systems
- Consistent batch-to-batch performance
- Gas analysis and detection
- Thermal imaging systems
- Weapons guidance systems
- Detector window protection
- IR photography and imaging
- Environmental monitoring
- Spectroscopy
- Industrial process control
- Medical diagnostics
- Research and development
- Diameter: 12.5mm, 25mm, and 50mm available
- Minimum Clear Aperture: 21mm
- Transmission: 75% minimum, 90% typical
- Humidity Resistance: Per MIL-C-48497A
- Abrasion Resistance: Moderate per MIL-C-48497A
- Adhesion: Per MIL-C-48497A
- Operating Temperature Range: -50°C to +70°C
- Wavelength Range: 2.7µm to 14µm
- Custom sizes available upon request
- Substrate: Optical-quality IR-transmitting materials
Showing all 13 results
- Wavelength: 10600 ±100
- Emission Line: CO2
- Operating Temperature: 23.0
- Parallelism: < 10 arc minutes
- Bandwidth (FWHM): 1500
- Minimum Transmission: > 80 %
- Blocking: 1x10-3 avg 200nm to 16.5 µm
- Size: 12.5 Ø +0.0 / -0.2
- Thickness: 1.0 ±0.2
- Scratch-Dig: 80/50
- Clear Aperture: 10mm Ø min
- Flatness: 5 or better at WL of Interest
- Effective Refractive Index: N/A
- Substrate: Ge
- Gas: CO2 Laser
- Wavelength: 10600 ±100
- Emission Line: CO2
- Operating Temperature: 23.0
- Parallelism: < 10 arc minutes
- Bandwidth (FWHM): 1500
- Minimum Transmission: > 80 %
- Blocking: 1x10-3 avg 200nm to 16.5 µm
- Size: 25.0 Ø +0.0 / -0.2
- Thickness: 1.0 ±0.2
- Scratch-Dig: 80/50
- Clear Aperture: 22mm dia.
- Flatness: 5λ or better at λ of Interest
- Effective Refractive Index: N/A
- Substrate: Ge
- Gas: CO2 Laser
- Wavelength: 10600 ±100
- Emission Line: CO2
- Operating Temperature: 23.0
- Parallelism: < 10 arc minutes
- Bandwidth (FWHM): 1500
- Minimum Transmission: > 80 %
- Blocking: 1x10-3 avg 200nm to 16.5 µm
- Size: 50.0 Ø +0.0 / -0.2
- Thickness: 1.0 ±0.2
- Scratch-Dig: 80/50
- Clear Aperture: 45mm Ø min
- Flatness: 5λ or better at λ of Interest
- Effective Refractive Index: N/A
- Substrate: Ge
- Gas: CO2 Laser
- Wavelength: 2700.0 ±30
- Emission Line: Water Vapor
- Operating Temperature: 23.0
- Parallelism: < 5 arc minutes
- Bandwidth (FWHM): 110
- Minimum Transmission: 75%
- Blocking: 1x10-3 avg. X-Ray to 30µ
- Size: 25.0 Ø +0 / -0.2
- Thickness: 1.0 ±0.2
- Scratch-Dig: 80/50
- Clear Aperture: 22mm dia.
- Flatness: 2λ or better at 633
- Effective Refractive Index: N/A
- Substrate: Sapphire
- Gas: Water vapor
- Wavelength: 2950.0 ±30
- Emission Line: Water Vapor
- Operating Temperature: 23.0
- Parallelism: < 5 arc minutes
- Bandwidth (FWHM): 110
- Minimum Transmission: 75%
- Blocking: 1x10-3 avg. X-Ray to 30µ
- Size: 25.0 Ø +0 / -0.2
- Thickness: 1.0 ±0.2
- Scratch-Dig: 80/50
- Clear Aperture: 22mm dia.
- Flatness: 2λ or better at 633
- Effective Refractive Index: N/A
- Substrate: Sapphire
- Gas: Water vapor
- Wavelength: 3460.0 ±40
- Emission Line: Methane and Ethanol
- Operating Temperature: 23.0
- Parallelism: < 5 arc minutes
- Bandwidth (FWHM): 140
- Minimum Transmission: 75%
- Blocking: 1x10-3 avg. X-Ray to 30µ
- Size: 25.0 Ø +0 / -0.2
- Thickness: 1.0 ±0.2
- Scratch-Dig: 80/50
- Clear Aperture: 22mm dia.
- Flatness: 2λ or better at 633
- Effective Refractive Index: N/A
- Substrate: Sapphire
- Gas: Methanol and Ethanol
- Wavelength: 3600 ±40
- Emission Line: Formaldehyde
- Operating Temperature: 23.0
- Parallelism: < 5 arc minutes
- Bandwidth (FWHM): 140
- Minimum Transmission: 75%
- Blocking: 1x10-3 avg. X-Ray to 30µ
- Size: 25.0 Ø +0 / -0.2
- Thickness: 1.0 ±0.2
- Scratch-Dig: 80/50
- Clear Aperture: 22mm dia.
- Flatness: 2λ or better at 633
- Effective Refractive Index: N/A
- Substrate: Sapphire
- Gas: Formaldehyde
- Emission Line: SWIR, L and M-Band
- Parallelism: < 10 arc minutes
- Bandwidth (FWHM): 2000
- Transmission: 80% (avg)
- Blocking: T(avg) <0.1 UV to 11000nm
- Size: 12.5 Ø +0.0 / -0.2
- Thickness: 1.00 ±0.2
- Scratch-Dig: 80/50
- Clear Aperture: 10mm Ø min
- Flatness: 5λ or better at λ of Interest
- Filter Type: --
- Substrate Material: N/A
- Emission Line: SWIR, L and M-Band
- Parallelism: < 10 arc minutes
- Bandwidth (FWHM): 2000
- Transmission: 80% (avg)
- Blocking: T(avg) <0.1 UV to 11000nm
- Size: 25.0 Ø +0.0 / -0.2
- Thickness: 1.00 ±0.2
- Scratch-Dig: 80/50
- Clear Aperture: 22mm dia.
- Flatness: 5λ or better at λ of Interest
- Filter Type: -
- Substrate Material: N/A
- Emission Line: SWIR, L and M-Band
- Parallelism: < 10 arc minutes
- Bandwidth (FWHM): 2000
- Transmission: 80% (avg)
- Blocking: T(avg) <0.1 UV to 11000nm
- Size: 50.0 +0.0 / -0.2
- Thickness: 1.00 ±0.2
- Scratch-Dig: 80/50
- Clear Aperture: 45mm Ø min
- Flatness: 5λ or better at λ of Interest
- Filter Type: --
- Substrate Material: N/A
- Wavelength: 4260.0 ±40
- Emission Line: CO2
- Operating Temperature: 23.0
- Parallelism: < 5 arc minutes
- Bandwidth (FWHM): 120
- Minimum Transmission: 75%
- Blocking: 1x10-3 avg. X-Ray to 30µ
- Size: 25.0 Ø +0 / -0.2
- Thickness: 1.0 ±0.2
- Scratch-Dig: 80/50
- Clear Aperture: 22mm dia.
- Flatness: 2λ or better at 633
- Effective Refractive Index: N/A
- Substrate: Sapphire
- Gas: CO2
- Wavelength: 4670.0 ±50
- Emission Line: Co
- Operating Temperature: 23.0
- Parallelism: < 5 arc minutes
- Bandwidth (FWHM): 150
- Minimum Transmission: 75%
- Blocking: 1x10-3 avg. X-Ray to 30µ
- Size: 25.0 Ø +0 / -0.2
- Thickness: 1.0 ±0.2
- Scratch-Dig: 80/50
- Clear Aperture: 22mm dia.
- Flatness: 2λ or better at 633
- Effective Refractive Index: N/A
- Substrate: Sapphire
- Gas: CO
- Wavelength: 5300.0 ±50
- Emission Line: NO
- Operating Temperature: 23.0
- Parallelism: < 5 arc minutes
- Bandwidth (FWHM): 420
- Minimum Transmission: 70%
- Blocking: 1x10-3 avg. X-Ray to 30µ
- Size: 25.0 Ø +0 / -0.2
- Thickness: 1.0 ±0.2
- Scratch-Dig: 80/50
- Clear Aperture: 22mm dia.
- Flatness: 2λ or better at 633
- Effective Refractive Index: N/A
- Substrate: Sapphire
- Gas: NO
PART NO.
DESCRIPTION
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> 10 pcs.
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In Stock