Metallic Neutral Density Filters UV-VIS-NIR
Metallic Neutral Density Filters UV-VIS-NIR
Metallic Neutral Density (ND) filters from Andover Corporation provide precise light attenuation with exceptional spectral neutrality across ultraviolet, visible, and near-infrared wavelengths. These high-quality filters employ a combination of absorption and reflection through a metal alloy coating on carefully selected substrates to reduce light intensity while maintaining spectral balance.
Unlike absorption-type filters, Andover's metallic ND filters offer greater linearity over an extended spectral range (250-2000nm), making them ideal for applications requiring consistent performance from UV through NIR. Available in a range of optical densities from 0.1 to 4.0, these filters deliver superior durability and reduced thermal effects, making them excellent for calibration, scientific measurements, low-power laser applications, and imaging systems. Custom configurations are available on both fused silica and glass substrates to meet specialized requirements across various optical wavelength regions.
- Broadband performance from 250–2000 nm (UV–VIS–NIR)
- Exceptional spectral linearity across extended wavelength ranges
- Minimal thermal effects in low-power laser applications
- High durability metallic alloy coating
- UV-grade fused silica (quartz) substrate
- Precise optical density control
- High surface quality for demanding imaging systems
- Custom size and configuration options available
- Calibration Systems
- Scientific Measurements
- Research Instrumentation
- UV Imaging Systems
- Low-Power Laser Systems (UV–NIR)
- Spectrophotometry
- Optical Testing
- Precision Light Attenuation
- Transmitted Wavefront: λ/4
- Parallelism: < 5 arcsec
- Spectral Range: 250–2000 nm
- Substrate: UV-Grade Fused Silica (Quartz)
- Available Formats:
- Individual filters
- Filter sets
- Customization Options:
- Sizes
- Optical Densities
- Mounting Options
| Optical Density | Nominal Transmission (%) | Transmission Deviation from Nominal (%) | ||
|---|---|---|---|---|
| 250-400nm | 400-800nm | 800-2000nm | ||
| 0.04 | 91.0 | +/- 3.0 | +/- 3.0 | +/- 3.0 |
| 0.10 | 79.5 | +/- 9.0 | +/- 3.0 | +/- 9.0 |
| 0.15 | 63.0 | +/- 8.0 | +/- 3.0 | +/- 8.0 |
| 0.20 | 63.0 | +/- 6.0 | +/- 2.0 | +/- 6.0 |
| 0.30 | 50.0 | +/- 5.0 | +/- 2.0 | +/- 5.0 |
| 0.40 | 39.1 | +/- 4.0 | +/- 2.0 | +/- 4.0 |
| 0.50 | 31.6 | +/- 4.0 | +/- 2.0 | +/- 4.0 |
| 0.60 | 25.0 | +/- 4.0 | +/- 1.5 | +/- 4.0 |
| 0.70 | 20.0 | +/- 4.0 | +/- 1.5 | +/- 4.0 |
| 0.80 | 15.5 | +/- 4.0 | +/- 1.5 | +/- 4.0 |
| 0.90 | 12.6 | +/- 3.5 | +/- 1.0 | +/- 3.5 |
| 1.00 | 10.0 | +/- 3.5 | +/- 1.0 | +/- 3.5 |
| 1.30 | 5.0 | +/- 3.0 | +/- 1.0 | +/- 3.0 |
| 1.50 | 3.2 | +/- 1.5 | +/- 0.5 | +/- 1.5 |
| 2.00 | 1.0 | +/- 0.5 | +/- 0.2 | +/- 0.5 |
| 2.50 | 0.32 | +/- 0.15 | +/- 0.07 | +/- 0.15 |
| 3.00 | 0.10 | +0.08/-0.06 | +/- 0.05 | +/- 0.10 |
| 4.00 | 0.01 | +/- 0.008 | +0.01/-0.008 | +/- 0.10 |
Showing 1–16 of 76 results
- Specifications: 250-400nm 79.5% ±9.0 , 400-800nm 79.5% ±3.0% , 800-2000nm 79.5% ±9.0%
- Parallelism: 30 arc seconds or better
- Size: 12.5 Ø +0.0 / -0.2
- Thickness: 1.50 ±0.5
- Scratch-Dig: 80/50
- Clear Aperture: 90%
- Flatness: 0.25 per inch or better
- Substrate: Quartz
- Angle of Incidence: 0
- %T (Optical Density): -
- Specifications: 250-400nm 79.5% ±9.0 , 400-800nm 79.5% ±3.0 , 800-2000nm 79.5% ±9.0
- Parallelism: 30 arc seconds or better
- Size: 25.0 Ø +0.0 / -0.2
- Thickness: 1.50 ±0.5
- Scratch-Dig: 80/50
- Clear Aperture: 90%
- Flatness: 0.25 per inch or better
- Substrate: Quartz
- Angle of Incidence: 0
- %T (Optical Density): -
- Specifications: 250-400nm 79.5% ±9.0 , 400-800nm 79.5% ±3.0 , 800-2000nm 79.5% ±9.0
- Parallelism: 30 arc seconds or better
- Size: 50.0 Ø +0.0 / -0.2
- Thickness: 1.50 ±0.5
- Scratch-Dig: 80/50
- Clear Aperture: 90%
- Flatness: 0.25 per inch or better
- Substrate: Quartz
- Angle of Incidence: 0
- %T (Optical Density): -
- Specifications: 250-400nm 79.5% ±9.0 , 400-800nm 79.5% ±3.0 , 800-2000nm 79.5% ±9.0
- Parallelism: 30 arc seconds or better
- Size: 50.0 x 50.0 +0.0 / -0.2
- Thickness: 1.50 ±0.5
- Scratch-Dig: 80/50
- Clear Aperture: 90%
- Flatness: 0.25 per inch or better
- Substrate: Quartz
- Angle of Incidence: 0
- %T (Optical Density): -
- Specifications: 250-400nm 70.8% ±8.0 , 400-800nm 70.8% ±3.0 , 800-2000nm 70.8% ±8.0
- Parallelism: 30 arc seconds or better
- Size: 12.5 Ø +0.0 / -0.2
- Thickness: 1.50 ±0.5
- Scratch-Dig: 80/50
- Clear Aperture: 90%
- Flatness: 0.25 per inch or better
- Substrate: Quartz
- Angle of Incidence: 0
- %T (Optical Density): -
- Specifications: 250-400nm 70.8% ±8.0 , 400-800nm 70.8% ±3.0 , 800-2000nm 70.8% ±8.0
- Parallelism: 30 arc seconds or better
- Size: 25.0 Ø +0.0 / -0.2
- Thickness: 1.50 ±0.5
- Scratch-Dig: 80/50
- Clear Aperture: 90%
- Flatness: 0.25 per inch or better
- Substrate: Quartz
- Angle of Incidence: 0
- %T (Optical Density): -
- Specifications: 250-400nm 70.8% ±8.0 , 400-800nm 70.8% ±3.0 , 800-2000nm 70.8% ±8.0
- Parallelism: 30 arc seconds or better
- Size: 50.0 Ø +0.0 / -0.2
- Thickness: 1.50 ±0.5
- Scratch-Dig: 80/50
- Clear Aperture: 90%
- Flatness: 0.25 per inch or better
- Substrate: Quartz
- Angle of Incidence: 0
- %T (Optical Density): -
- Specifications: 250-400nm 70.8% ±8.0 , 400-800nm 70.8% ±3.0 , 800-2000nm 70.8% ±8.0
- Parallelism: 30 arc seconds or better
- Size: 50.0 x 50.0 +0.0 / -0.2
- Thickness: 1.50 ±0.5
- Scratch-Dig: 80/50
- Clear Aperture: 90%
- Flatness: 0.25 per inch or better
- Substrate: Quartz
- Angle of Incidence: 0
- %T (Optical Density): -
- Specifications: 250-400nm 63.0% ±6.0 , 400-800nm 63.0% ±2.0 , 800-2000nm 63.0% ±6.0
- Parallelism: 30 arc seconds or better
- Size: 12.5 Ø +0.0 / -0.2
- Thickness: 1.50 ±0.5
- Scratch-Dig: 80/50
- Clear Aperture: 90%
- Flatness: 0.25 per inch or better
- Substrate: Quartz
- Angle of Incidence: 0
- %T (Optical Density): -
- Specifications: 250-400nm 63.0% ±6.0 , 400-800nm 63.0% ±2.0 , 800-2000nm 63.0% ±6.0
- Parallelism: 30 arc seconds or better
- Size: 25.0 Ø +0.0 / -0.2
- Thickness: 1.50 ±0.5
- Scratch-Dig: 80/50
- Clear Aperture: 90%
- Flatness: 0.25 per inch or better
- Substrate: Quartz
- Angle of Incidence: 0
- %T (Optical Density): -
- Specifications: 250-400nm 63.0% ±6.0 , 400-800nm 63.0% ±2.0 , 800-2000nm 63.0% ±6.0
- Parallelism: 30 arc seconds or better
- Size: 50.0 Ø +0.0 / -0.2
- Thickness: 1.50 ±0.5
- Scratch-Dig: 80/50
- Clear Aperture: 90%
- Flatness: 0.25 per inch or better
- Substrate: Quartz
- Angle of Incidence: 0
- %T (Optical Density): -
- Specifications: 250-400nm 63.0% ±6.0 , 400-800nm 63.0% ±2.0 , 800-2000nm 63.0% ±6.0
- Parallelism: 30 arc seconds or better
- Size: 50.0 x 50.0 +0.0 / -0.2
- Thickness: 1.50 ±0.5
- Scratch-Dig: 80/50
- Clear Aperture: 90%
- Flatness: 0.25 per inch or better
- Substrate: Quartz
- Angle of Incidence: 0
- %T (Optical Density): -
- Specifications: - 91% ± 3.0% 250-2000nm- Un-coated quartz
- Parallelism: 30 arc seconds or better
- Size: 12.5 Ø +0.0 / -0.2
- Thickness: 1.50 ±0.5
- Scratch-Dig: 80/50
- Clear Aperture: 90%
- Flatness: 0.25 per inch or better
- Substrate: N/A
- Angle of Incidence: 0
- %T (Optical Density): -
- Specifications: - 91% ± 3.0% 250-2000nm- Un-coated quartz
- Parallelism: 30 arc seconds or better
- Size: 25.0 Ø +0.0 / -0.2
- Thickness: 1.50 ±0.5
- Scratch-Dig: 80/50
- Clear Aperture: 90%
- Flatness: 0.25 per inch or better
- Substrate: N/A
- Angle of Incidence: 0
- %T (Optical Density): -
- Specifications: 91% ±3.0% from 250-2000nm , Un-coated Fused Silica
- Parallelism: 30 arc seconds or better
- Size: 50.0 Ø +0.0 / -0.2
- Thickness: 1.50 ±0.5
- Scratch-Dig: 80/50
- Clear Aperture: 90%
- Flatness: 0.25 per inch or better
- Substrate: N/A
- Angle of Incidence: 0
- %T (Optical Density): -
- Specifications: 91% ±3.0% from 250-2000nm , Un-coated Fused Silica
- Parallelism: 30 arc seconds or better
- Size: 50.0 x 50.0 +0.0 / -0.2
- Thickness: 1.50 ±0.5
- Scratch-Dig: 80/50
- Clear Aperture: 90%
- Flatness: 0.25 per inch or better
- Substrate: N/A
- Angle of Incidence: 0
- %T (Optical Density): -