Beamsplitter
Beamsplitter
Beamsplitters operate by splitting light based on reflection/transmission (R/T) ratios or specific properties like polarization or wavelength. Available in cube and plate configurations, these versatile components serve critical roles in optical systems across multiple industries.
Andover Corporation manufactures high-precision beamsplitters with superior coating technology and rigorous quality control, ensuring optimal performance for demanding applications.
Contact Andover Corporation to discuss your specific beamsplitter requirements and discover the optimal solution for your application.
- Standard Beamsplitters - Split unpolarized light at specific R/T ratios
- Polarizing Beamsplitters - Separate S and P polarization states
- Non-Polarizing Beamsplitters - Maintain polarization while splitting light
- Dichroic Beamsplitters - Split light by wavelength
- Cube Beamsplitters - Cemented prism pairs with coated interface
- Plate Beamsplitters - Coated flat glass optimized for 45° incidence
- Custom coating options for specific applications
- Back surface Anti-Reflection coatings <1.5% average
- High-precision manufacturing
- Vertically integrated production
- Superior durability
- Consistent performance
- Short lead times
- Aerospace and Defense Systems
- Laser Alignment
- Medical Imaging
- Industrial Machine Vision
- Scientific Instruments
- Spectroscopy
- Fluorescence Studies
Showing all 21 results
- Wavelength: 420 - 700
- Operating Temperature: 23.0
- Parallelism: 30 arc seconds or better
- Transmission: 70 ±5%
- Reflection: R = 30 ±5%
- Size: 25.0 Ø +0 / -0.2
- Thickness: 3.0 ±0.25
- Scratch-Dig: 60/40
- Clear Aperture: 22mm Ø min
- Flatness: 1/4 wave per inch or better
- Substrate: Fused Silica
- Angle of Incidence: 45.0
- Wavelength: 420 - 700
- Operating Temperature: 23.0
- Parallelism: 30 arc seconds or better
- Transmission: 70 ±5%
- Reflection: R = 30 ±5%
- Size: 50.0 Ø +0 / -0.2
- Thickness: 3.0 ±0.25
- Scratch-Dig: 60/40
- Clear Aperture: 45mm min
- Flatness: 1/4 wave per inch or better
- Substrate: Fused Silica
- Angle of Incidence: 45.0
- Wavelength: 420 - 700
- Operating Temperature: 23.0
- Parallelism: 30 arc seconds or better
- Transmission: 70 ±5%
- Reflection: R = 30 ±5%
- Size: 50.0 x 50.0 +0 / -0.2
- Thickness: 3.0 ±0.25
- Scratch-Dig: 60/40
- Clear Aperture: 45mm min
- Flatness: 1/4 wave per inch or better
- Substrate: Fused Silica
- Angle of Incidence: 45.0
- Wavelength: 420 - 700
- Operating Temperature: 23.0
- Parallelism: 30 arc seconds or better
- Transmission: 60 ±5%
- Reflection: R = 40 ±5%
- Size: 25.0 Ø +0 / -0.2
- Thickness: 3.0 ±0.25
- Scratch-Dig: 60/40
- Clear Aperture: 22mm Ø min
- Flatness: 1/4 wave per inch or better
- Substrate: Fused Silica
- Angle of Incidence: 45.0
- Wavelength: 420 - 700
- Operating Temperature: 23.0
- Parallelism: 30 arc seconds or better
- Transmission: 60 ±5%
- Reflection: R = 40 ±5%
- Size: 50.0 Ø +0 / -0.2
- Thickness: 3.0 ±0.25
- Scratch-Dig: 60/40
- Clear Aperture: 45mm min
- Flatness: 1/4 wave per inch or better
- Substrate: Fused Silica
- Angle of Incidence: 45.0
- Wavelength: 420 - 700
- Operating Temperature: 23.0
- Parallelism: 30 arc seconds or better
- Transmission: 60 ±5%
- Reflection: R = 40 ±5%
- Size: 50.0 x 50.0 +0 / -0.2
- Thickness: 3.0 ±0.25
- Scratch-Dig: 60/40
- Clear Aperture: 45mm min
- Flatness: 1/4 wave per inch or better
- Substrate: Fused Silica
- Angle of Incidence: 45.0
- Wavelength: 420 - 700
- Operating Temperature: 23.0
- Parallelism: 30 arc seconds or better
- Transmission: 50 ±5%
- Reflection: R = 50 ±5%
- Size: 25.0 Ø +0 / -0.2
- Thickness: 3.0 ±0.25
- Scratch-Dig: 60/40
- Clear Aperture: 22mm Ø min
- Flatness: 1/4 wave per inch or better
- Substrate: Fused Silica
- Angle of Incidence: 45.0
- Wavelength: 420 - 700
- Operating Temperature: 23.0
- Parallelism: 30 arc seconds or better
- Transmission: 50 ±5%
- Reflection: R = 50 ±5%
- Size: 50.0 Ø +0 / -0.2
- Thickness: 3.0 ±0.25
- Scratch-Dig: 60/40
- Clear Aperture: 45mm min
- Flatness: 1/4 wave per inch or better
- Substrate: Fused Silica
- Angle of Incidence: 45.0
- Wavelength: 420 - 700
- Operating Temperature: 23.0
- Parallelism: 30 arc seconds or better
- Transmission: 50 ±5%
- Reflection: R = 50 ±5%
- Size: 50.0 x 50.0 +0 / -0.2
- Thickness: 3.0 ±0.25
- Scratch-Dig: 60/40
- Clear Aperture: 45mm min
- Flatness: 1/4 wave per inch or better
- Substrate: Fused Silica
- Angle of Incidence: 45.0
- Wavelength: 420 - 700
- Operating Temperature: 23.0
- Parallelism: 30 arc seconds or better
- Transmission: 40 ±5%
- Reflection: R = 60 ±5%
- Size: 25.0 Ø +0 / -0.2
- Thickness: 3.0 ±0.25
- Scratch-Dig: 60/40
- Clear Aperture: 22mm Ø min
- Flatness: 1/4 wave per inch or better
- Substrate: Fused Silica
- Angle of Incidence: 45.0
- Wavelength: 420 - 700
- Operating Temperature: 23.0
- Parallelism: 30 arc seconds or better
- Transmission: 40 ±5%
- Reflection: R = 60 ±5%
- Size: 50.0 Ø +0 / -0.2
- Thickness: 3.0 ±0.25
- Scratch-Dig: 60/40
- Clear Aperture: 45mm min
- Flatness: 1/4 wave per inch or better
- Substrate: Fused Silica
- Angle of Incidence: 45.0
- Wavelength: 420 - 700
- Operating Temperature: 23.0
- Parallelism: 30 arc seconds or better
- Transmission: 40 ±5%
- Reflection: R = 60 ±5%
- Size: 50.0 x 50.0 +0 / -0.2
- Thickness: 3.0 ±0.25
- Scratch-Dig: 60/40
- Clear Aperture: 45mm min
- Flatness: 1/4 wave per inch or better
- Substrate: Fused Silica
- Angle of Incidence: 45.0
- Wavelength: 420 - 700
- Operating Temperature: 23.0
- Parallelism: 30 arc seconds or better
- Transmission: 30 ±5%
- Reflection: R = 70 ±5%
- Size: 25.0 Ø +0 / -0.2
- Thickness: 3.0 ±0.25
- Scratch-Dig: 60/40
- Clear Aperture: 22mm Ø min
- Flatness: 1/4 wave per inch or better
- Substrate: Fused Silica
- Angle of Incidence: 45.0
- Wavelength: 420 - 700
- Operating Temperature: 23.0
- Parallelism: 30 arc seconds or better
- Transmission: 30 ±5%
- Reflection: R = 70 ±5%
- Size: 50.0 Ø +0 / -0.2
- Thickness: 3.0 ±0.25
- Scratch-Dig: 60/40
- Clear Aperture: 45mm min
- Flatness: 1/4 wave per inch or better
- Substrate: Fused Silica
- Angle of Incidence: 45.0
- Wavelength: 420 - 700
- Operating Temperature: 23.0
- Parallelism: 30 arc seconds or better
- Transmission: 30 ±5%
- Reflection: R = 70 ±5%
- Size: 50.0 x 50.0 +0 / -0.2
- Thickness: 3.0 ±0.25
- Scratch-Dig: 60/40
- Clear Aperture: 45mm min
- Flatness: 1/4 wave per inch or better
- Substrate: Fused Silica
- Angle of Incidence: 45.0
- Wavelength: 420 - 700
- Operating Temperature: 23.0
- Parallelism: 30 arc seconds or better
- Transmission: 20 ±5%
- Reflection: R = 80 +/-5%
- Size: 25.0 Ø +0 / -0.2
- Thickness: 3.0 ±0.25
- Scratch-Dig: 60/40
- Clear Aperture: 22mm Ø min
- Flatness: 1/4 wave per inch or better
- Substrate: Fused Silica
- Angle of Incidence: 45.0
- Wavelength: 420 - 700
- Operating Temperature: 23.0
- Parallelism: 30 arc seconds or better
- Transmission: 20+/-5%
- Reflection: R = 80 +/-5%
- Size: 50.0 Ø +0 / -0.2
- Thickness: 3.0 ±0.25
- Scratch-Dig: 60/40
- Clear Aperture: 45mm min
- Flatness: 1/4 wave per inch or better
- Substrate: Fused Silica
- Angle of Incidence: 45.0
- Wavelength: 420 - 700
- Operating Temperature: 23.0
- Parallelism: 30 arc seconds or better
- Transmission: 20 ±5%
- Reflection: R = 80 ±5%
- Size: 50.0 x 50.0 +0 / -0.2
- Thickness: 3.0 ±0.25
- Scratch-Dig: 60/40
- Clear Aperture: 45mm min
- Flatness: 1/4 wave per inch or better
- Substrate: Fused Silica
- Angle of Incidence: 45.0
- Wavelength: 700 - 1200
- Operating Temperature: 23.0
- Parallelism: 30 arc seconds or better
- Transmission: 50+/-5%
- Reflection: R = 50 +/-5%
- Size: 25.0 Ø +0 / -0.2
- Thickness: 3.0 ±0.25
- Scratch-Dig: 60/40
- Clear Aperture: 22mm Ø min
- Flatness: 1/4 wave per inch or better
- Substrate: Fused Silica
- Angle of Incidence: 45.0
- Wavelength: 700 - 1200
- Operating Temperature: 23.0
- Parallelism: 30 arc seconds or better
- Transmission: 50+/-5%
- Reflection: R = 50 +/-5%
- Size: 50.0 Ø +0 / -0.2
- Thickness: 3.0 ±0.25
- Scratch-Dig: 60/40
- Clear Aperture: 45mm Ø min
- Flatness: 1/4 wave per inch or better
- Substrate: Fused Silica
- Angle of Incidence: 45.0
- Wavelength: 700 - 1200
- Operating Temperature: 23.0
- Parallelism: 30 arc seconds or better
- Transmission: 50+/-5%
- Reflection: R = 50 +/-5%
- Size: 50.0 x 50.0 +0 / -0.2
- Thickness: 3.0 ±0.25
- Scratch-Dig: 60/40
- Clear Aperture: 45mm Ø min
- Flatness: 1/4 wave per inch or better
- Substrate: Fused Silica
- Angle of Incidence: 45.0
PART NO.
DESCRIPTION
1 - 5 pcs.
6 - 10 pcs.
> 10 pcs.
Stock Status
$159.00
$137.00
$121.00
In Stock
$308.00
$265.00
$234.00
In Stock
$320.00
$275.00
$243.00
In Stock
$159.00
$137.00
$121.00
In Stock
$308.00
$265.00
$234.00
In Stock
$320.00
$275.00
$243.00
In Stock
$159.00
$137.00
$121.00
In Stock
$308.00
$265.00
$234.00
In Stock
$320.00
$275.00
$243.00
In Stock
$159.00
$137.00
$121.00
In Stock
$308.00
$265.00
$234.00
In Stock
$320.00
$275.00
$243.00
In Stock
$159.00
$137.00
$121.00
In Stock
$308.00
$265.00
$234.00
In Stock
$320.00
$275.00
$243.00
In Stock
$159.00
$137.00
$121.00
In Stock
$308.00
$265.00
$234.00
In Stock
$320.00
$275.00
$243.00
In Stock
$159.00
$137.00
$121.00
In Stock
$308.00
$265.00
$234.00
In Stock
$320.00
$275.00
$243.00
In Stock