Showing 497–512 of 1277 results
- Wavelength: 396.5 ±0.1
- Emission Line: N/A
- Operating Temperature: 23.0
- Parallelism: Commercial
- Bandwidth (FWHM): 0.5 ±0.1 nm
- Minimum Transmission: 8%
- Blocking: 1 x 10-4 avg. X-Ray to FIR
- Size: 25.0 ¯ +0 / -0.25
- Thickness: 8.5 +0 / -nom
- Scratch-Dig: 80/50
- Clear Aperture: 21mm ¯ min
- Flatness: Commercial
- Effective Refractive Index: N/A
- Filter Type: 2
- Wavelength: 400
- Operating Temperature: 23.0
- Parallelism: Commercial
- Transmission: 90% 405 to 420nm
- Blocking: R(Ave) > 95 % from 360 - 388 nm
- Size: 50.8 ¯ +0.0 / -0.2
- Thickness: 5.0 ±0.2
- Scratch-Dig: 80/50
- Clear Aperture: 41.0
- Flatness: Commercial
- Angle of Incidence: 45.0
- 50% Cut-on Wavelength: 400
- Parallelism: 30 arc seconds or better
- Size: 12.5 ¯ +0.0 / -0.25
- Thickness: 2.82mm ±nom
- Scratch-Dig: 80/50
- Clear Aperture: 90%
- Flatness: 0.25 wave per inch or better
- Angle of Incidence: 0
- %T (Optical Density): -
- Parallelism: 30 arc seconds or better
- Size: 25.0 ¯ +0.0 / -0.25
- Thickness: 2.82mm ±nom
- Scratch-Dig: 80/50
- Clear Aperture: 90%
- Flatness: 0.25 wave per inch or better
- Angle of Incidence: 0
- %T (Optical Density): -
- Parallelism: 30 arc seconds or better
- Size: 50.0 ¯ +0.0 / -0.25
- Thickness: 2.82 ±nom
- Scratch-Dig: 80/50
- Clear Aperture: 90%
- Flatness: 0.25 wave per inch or better
- Angle of Incidence: 0
- %T (Optical Density): -
- Wavelength: 400.8 +0.3 / -0
- Emission Line: N/A
- Operating Temperature: 23.0
- Parallelism: Commercial
- Bandwidth (FWHM): 1.5 ±0.3 nm
- Minimum Transmission: 10%
- Blocking: 1x10-4 avg. X-Ray to 1000nm
- Size: 25.0 ¯ +0 / -0.25
- Thickness: 9.5 +0 / -nom
- Scratch-Dig: 80/50
- Clear Aperture: 21mm ¯ min
- Flatness: Commercial
- Effective Refractive Index: N/A
- Filter Type: 2
- Wavelength: 3950 ±100
- Emission Line: N/A
- Operating Temperature: 23
- Parallelism: Commercial
- Bandwidth (FWHM): 1950 ±100 nm
- Minimum Transmission: 85
- Blocking: T(avg) <0.1 X-ray to 7400nm
- Size: 25.0 ¯ +0.0 / -0.1
- Thickness: 2.28 ±0.1
- Scratch-Dig: 80/50
- Clear Aperture: 22mm ¯ min
- Flatness: 3 -5 per inch
- Effective Refractive Index: N/A
- Substrate: Silicon
- Gas: N/A
- Wavelength: 4000 ±40
- Emission Line: N/A
- Operating Temperature: 23.0
- Parallelism: Customer Supplied
- Bandwidth (FWHM): 800 ±40 nm
- Minimum Transmission: 90%
- Blocking: 1x10-3 avg. X-Ray to FIR
- Size: 0.500 +0.000 / -0.004
- Thickness: 0.020 ±0.002
- Scratch-Dig: 80/50
- Clear Aperture: 0.440 in. min.
- Flatness: Customer Supplied
- Effective Refractive Index: N/A
- Substrate: Sapphire
- Gas: N/A
- Emission Line: SWIR, L and M-Band
- Parallelism: < 10 arc minutes
- Bandwidth (FWHM): 2000 ±200 nm
- Transmission: 80% (avg)
- Blocking: T(avg) <0.1 UV to 11000nm
- Size: 12.5 ¯ +0.0 / -0.2
- Thickness: 1.00 ±0.2
- Scratch-Dig: 80/50
- Clear Aperture: 10mm ¯ min
- Flatness: 5 or better at of Interest
- Filter Type: --
- Substrate Material: Silicon
- Emission Line: SWIR, L and M-Band
- Parallelism: < 10 arc minutes
- Bandwidth (FWHM): 2000 ±200 nm
- Transmission: 80% (avg)
- Blocking: T(avg) <0.1 UV to 11000nm
- Size: 25.0 ¯ +0.0 / -0.2
- Thickness: 1.00 ±0.2
- Scratch-Dig: 80/50
- Clear Aperture: 22mm dia.
- Flatness: 5 or better at of Interest
- Filter Type: -
- Substrate Material: Silicon
- Emission Line: SWIR, L and M-Band
- Parallelism: < 10 arc minutes
- Bandwidth (FWHM): 2000 ±200 nm
- Transmission: 80% (avg)
- Blocking: T(avg) <0.1 UV to 11000nm
- Size: 50.0 +0.0 / -0.2
- Thickness: 1.00 ±0.2
- Scratch-Dig: 80/50
- Clear Aperture: 45mm ¯ min
- Flatness: 5 or better at of Interest
- Filter Type: --
- Substrate Material: Silicon
- Wavelength: 4260.0 ±40
- Emission Line: CO2
- Operating Temperature: 23.0
- Parallelism: < 5 arc minutes
- Bandwidth (FWHM): 120 ±30 nm
- Minimum Transmission: 75%
- Blocking: 1x10-3 avg. X-Ray to 30µ
- Size: 25.0 ¯ +0 / -0.2
- Thickness: 1.0 ±0.2
- Scratch-Dig: 80/50
- Clear Aperture: 22mm dia.
- Flatness: 2 or better at 633
- Effective Refractive Index: N/A
- Substrate: Sapphire
- Gas: CO2
- Wavelength: 4500.0 ±180
- Operating Temperature: 23.0
- Parallelism: < 10 arc minutes
- Transmission: 85%
- Blocking: 1x10-3 avg. 200nm to 4500nm
- Size: 12.5 ¯ +0 / -0.2
- Thickness: 1.0 ±0.2
- Scratch-Dig: 80/50
- Clear Aperture: 11mm
- Flatness: 5 or better at of Interest
- Substrate: Germanium
- Angle of Incidence: 0
- 5% Wavelength: N/A
- Wavelength: 4500.0 ±180
- Operating Temperature: 23.0
- Parallelism: < 10 arc minutes
- Transmission: 85%
- Blocking: 1x10-3 avg. 200nm to 4500nm
- Size: 25.0 ¯ +0 / -0.2
- Thickness: 1.0 ±0.2
- Scratch-Dig: 80/50
- Clear Aperture: 22mm
- Flatness: 5 or better at of Interest
- Substrate: Germanium
- Angle of Incidence: 0
- 5% Wavelength: N/A
- Wavelength: 4500.0 ±180
- Operating Temperature: 23.0
- Parallelism: < 10 arc minutes
- Transmission: 85%
- Blocking: 1x10-3 avg. 200nm to 4500nm
- Size: 50.0 ¯ +0 / -0.2
- Thickness: 1.0 ±0.2
- Scratch-Dig: 80/50
- Clear Aperture: 45mm
- Flatness: 5 or better at of Interest
- Substrate: Germanium
- Angle of Incidence: 0
- 5% Wavelength: N/A
- Wavelength: 4670.0 ±50
- Emission Line: Co
- Operating Temperature: 23.0
- Parallelism: < 5 arc minutes
- Bandwidth (FWHM): 150 ±30 nm
- Minimum Transmission: 75%
- Blocking: 1x10-3 avg. X-Ray to 30µ
- Size: 25.0 ¯ +0 / -0.2
- Thickness: 1.0 ±0.2
- Scratch-Dig: 80/50
- Clear Aperture: 22mm dia.
- Flatness: 2 or better at 633
- Effective Refractive Index: N/A
- Substrate: Sapphire
- Gas: CO
PART NO.
DESCRIPTION
1 - 5 pcs.
6 - 10 pcs.
> 10 pcs.
Stock Status
$650.00
$650.00
$650.00
In Stock: 1
$790.00
$790.00
$790.00
In Stock: 6
$51.00
$46.00
$39.00
In Stock
$105.00
$96.00
$80.00
In Stock
$234.00
$213.00
$178.00
In Stock
$485.00
$485.00
$485.00
In Stock: 11
$353.00
$353.00
$353.00
In Stock: 1
$175.00
$175.00
$175.00
In Stock: 38
$129.00
$111.00
$98.00
In Stock
$265.00
$228.00
$201.00
In Stock
$534.00
$459.00
$406.00
In Stock
$401.00
$345.00
$305.00
In Stock
$212.00
$178.00
$151.00
In Stock
$469.00
$394.00
$333.00
In Stock
$772.00
$648.00
$548.00
In Stock
$401.00
$345.00
$305.00
In Stock