Standard IR Bandpass Filters

Standard IR Bandpass Filters
Andover Corporation's standard IR bandpass filters are precision-engineered optical components designed specifically for gas analysis applications in the infrared spectrum.
These filters feature durable first-surface dielectric coatings on high-quality IR-transmitting substrates, enabling precise wavelength selection from 2.7µm to 14µm.
Built for reliability and performance, these filters combine superior optical qualities with robust construction to deliver consistent results in demanding applications.
- High-quality optical performance with precise wavelength selection
- Durable first-surface dielectric coatings for extended lifetime
- Available from stock for quick delivery
- Custom sizes and shapes available
- Suitable for high-volume production
- Normal cleaning and handling durability
- Compatible with standard optical mounting systems
- Consistent batch-to-batch performance
- Gas analysis and detection
- Thermal imaging systems
- Weapons guidance systems
- Detector window protection
- IR photography and imaging
- Environmental monitoring
- Spectroscopy
- Industrial process control
- Medical diagnostics
- Research and development
- Diameter: 25.0mm +0/-0.1mm (standard)
- Minimum Clear Aperture: 21mm
- Transmission: 75% minimum, 90% typical
- Humidity Resistance: Per MIL-C-48497A
- Abrasion Resistance: Moderate per MIL-C-48497A
- Adhesion: Per MIL-C-48497A
- Operating Temperature Range: -50°C to +70°C
- Wavelength Range: 2.7µm to 14µm
- Custom sizes available upon request
- Substrate: Optical-quality IR-transmitting materials
Showing all 15 results
- Center Wavelength: 2700 + 30/ - 30
- Wavelength Tolerance: + 30/ - 30
- Bandwidth: 110 ±0/±0 nm
- Transmission: 75%
- Blocking: 1x10-3 avg. X-Ray to 30µ
- Size: 25.0 Ø
- Thickness: 1.0
- Scratch-Dig: 80/50
- Clear Aperture: 22mm dia.
- Flatness: 2λ or better at 633
- Parallelism: < 5 arc minutes
- Operating Temperature: N/A
- Substrate: Sapphire
- Gas: Water vapor
- Center Wavelength: 2950 + 30/ - 30
- Wavelength Tolerance: + 30/ - 30
- Bandwidth: 110 ±0/±0 nm
- Transmission: 75%
- Blocking: 1x10-3 avg. X-Ray to 30µ
- Size: 25.0 Ø
- Thickness: 1.0
- Scratch-Dig: 80/50
- Clear Aperture: 22mm dia.
- Flatness: 2λ or better at 633
- Parallelism: < 5 arc minutes
- Operating Temperature: N/A
- Substrate: Sapphire
- Gas: Water vapor
- Center Wavelength: 3460 + 40/ - 40
- Wavelength Tolerance: + 40/ - 40
- Bandwidth: 140 ±0/±0 nm
- Transmission: 75%
- Blocking: 1x10-3 avg. X-Ray to 30µ
- Size: 25.0 Ø
- Thickness: 1.0
- Scratch-Dig: 80/50
- Clear Aperture: 22mm dia.
- Flatness: 2λ or better at 633
- Parallelism: < 5 arc minutes
- Operating Temperature: N/A
- Substrate: Sapphire
- Gas: Methanol and Ethanol
- Center Wavelength: 3600 + 40/ - 40
- Wavelength Tolerance: + 40/ - 40
- Bandwidth: 140 ±0/±0 nm
- Transmission: 75%
- Blocking: 1x10-3 avg. X-Ray to 30µ
- Size: 25.0 Ø
- Thickness: 1.0
- Scratch-Dig: 80/50
- Clear Aperture: 22mm dia.
- Flatness: 2λ or better at 633
- Parallelism: < 5 arc minutes
- Operating Temperature: N/A
- Substrate: Sapphire
- Gas: Formaldehyde
- Center Wavelength: 4000 + 200/ - 200
- Wavelength Tolerance: + 200/ - 200
- Bandwidth: 2000 ±0/±0 nm
- Transmission: 80% (avg)
- Blocking: T(avg) <0.1 UV to 11000nm
- Size: 50.0
- Thickness: 1.00
- Scratch-Dig: 80/50
- Clear Aperture: 10mm Ø min
- Flatness: 5λ or better at λ of Interest
- Parallelism: < 10 arc minutes
- Operating Temperature: N/A
- Substrate: Silicon
- Gas: N/A
- Center Wavelength: 4000 + 200/ - 200
- Wavelength Tolerance: + 200/ - 200
- Bandwidth: 2000 ±0/±0 nm
- Transmission: 80% (avg)
- Blocking: T(avg) <0.1 UV to 11000nm
- Size: 25.0 Ø
- Thickness: 1.00
- Scratch-Dig: 80/50
- Clear Aperture: 22mm dia.
- Flatness: 5λ or better at λ of Interest
- Parallelism: < 10 arc minutes
- Operating Temperature: N/A
- Substrate: Silicon
- Gas: SWIR
- Center Wavelength: 4260 + 40/ - 40
- Wavelength Tolerance: + 40/ - 40
- Bandwidth: 120 ±0/±0 nm
- Transmission: 75%
- Blocking: 1x10-3 avg. X-Ray to 30µ
- Size: 25.0 Ø
- Thickness: 1.0
- Scratch-Dig: 80/50
- Clear Aperture: 22mm dia.
- Flatness: 2λ or better at 633
- Parallelism: < 5 arc minutes
- Operating Temperature: N/A
- Substrate: Sapphire
- Gas: CO2
- Center Wavelength: 4670 + 50/ - 50
- Wavelength Tolerance: + 50/ - 50
- Bandwidth: 150 ±0/±0 nm
- Transmission: 75%
- Blocking: 1x10-3 avg. X-Ray to 30µ
- Size: 25.0 Ø
- Thickness: 1.0
- Scratch-Dig: 80/50
- Clear Aperture: 22mm dia.
- Flatness: 2λ or better at 633
- Parallelism: < 5 arc minutes
- Operating Temperature: N/A
- Substrate: Sapphire
- Gas: CO
- Center Wavelength: 4000 + 200/ - 200
- Wavelength Tolerance: + 200/ - 200
- Bandwidth: 2000 ±0/±0 nm
- Transmission: 80% (avg)
- Blocking: T(avg) <0.1 UV to 11000nm
- Size: 50.0
- Thickness: 1.00
- Scratch-Dig: 80/50
- Clear Aperture: 45mm Ø min
- Flatness: 5λ or better at λ of Interest
- Parallelism: < 10 arc minutes
- Operating Temperature: N/A
- Substrate: Silicon
- Gas: N/A
- Center Wavelength: 5300 + 50/ - 50
- Wavelength Tolerance: + 50/ - 50
- Bandwidth: 420 ±0/±0 nm
- Transmission: 70%
- Blocking: 1x10-3 avg. X-Ray to 30µ
- Size: 25.0 Ø
- Thickness: 1.0
- Scratch-Dig: 80/50
- Clear Aperture: 22mm dia.
- Flatness: 2λ or better at 633
- Parallelism: < 5 arc minutes
- Operating Temperature: N/A
- Substrate: Sapphire
- Gas: NO
- Center Wavelength: 10600 + 100/ - 100
- Wavelength Tolerance: + 100/ - 100
- Bandwidth: 1500 ±0/±0 nm
- Transmission: > 80 %
- Blocking: 1x10-3 avg 200nm to 16.5 µm
- Size: 12.5 Ø
- Thickness: 1.0
- Scratch-Dig: 80/50
- Clear Aperture: 10mm Ø min
- Flatness: 5 or better at WL of Interest
- Parallelism: < 10 arc minutes
- Operating Temperature: N/A
- Substrate: Ge
- Gas: CO2 Laser
- Center Wavelength: 10000 + 300/ - 300
- Wavelength Tolerance: + 300/ - 300
- Bandwidth: 4000 ±0/±0 nm
- Transmission: > 80 % Ave
- Blocking: < 0.1 % (avg) UV to 17 microns
- Size: 25.0 Ø
- Thickness: 1.0
- Scratch-Dig: 80/50
- Clear Aperture: 22mm dia.
- Flatness: 5λ or better at λ of Interest
- Parallelism: < 10 arc minutes
- Operating Temperature: N/A
- Substrate: Ge
- Gas: FIR Broadband
- Center Wavelength: 10600 + 100/ - 100
- Wavelength Tolerance: + 100/ - 100
- Bandwidth: 1500 ±0/±0 nm
- Transmission: > 80 %
- Blocking: 1x10-3 avg 200nm to 16.5 µm
- Size: 25.0 Ø
- Thickness: 1.0
- Scratch-Dig: 80/50
- Clear Aperture: 22mm dia.
- Flatness: 5λ or better at λ of Interest
- Parallelism: < 10 arc minutes
- Operating Temperature: N/A
- Substrate: Ge
- Gas: CO2 Laser
- Center Wavelength: 10000 + 300/ - 300
- Wavelength Tolerance: + 300/ - 300
- Bandwidth: 4000 ±0/±0 nm
- Transmission: > 80 % Ave
- Blocking: < 0.1 % (avg) UV to 17 microns
- Size: 50.0 Ø
- Thickness: 1.0
- Scratch-Dig: 80/50
- Clear Aperture: 45mm Ø min
- Flatness: 5λ or better at λ of Interest
- Parallelism: < 10 arc minutes
- Operating Temperature: N/A
- Substrate: Ge
- Gas: N/A
- Center Wavelength: 10600 + 100/ - 100
- Wavelength Tolerance: + 100/ - 100
- Bandwidth: 1500 ±0/±0 nm
- Transmission: > 80 %
- Blocking: 1x10-3 avg 200nm to 16.5 µm
- Size: 50.0 Ø
- Thickness: 1.0
- Scratch-Dig: 80/50
- Clear Aperture: 45mm Ø min
- Flatness: 5λ or better at λ of Interest
- Parallelism: < 10 arc minutes
- Operating Temperature: N/A
- Substrate: Ge
- Gas: CO2 Laser
PART NO.
DESCRIPTION
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$367.00
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$316.00
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$316.00
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$279.00
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$367.00
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$316.00
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$279.00
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$367.00
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$316.00
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$279.00
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$118.00
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$101.00
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$367.00
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$316.00
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$279.00
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$367.00
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$316.00
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$279.00
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$421.00
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$367.00
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$316.00
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